Title :
A 128k 6.5 ns access/5 ns cycle CMOS ECL static RAM
Author :
Towler, F. ; Chu, J. ; Houghton, R. ; Lane, P. ; Chappell, B.A. ; Chappell, T.I. ; Schuster, S.E.
Author_Institution :
IBM, Essex Junction, VT, USA
Abstract :
The authors describe an experimental 128k CMOS ECL-(emitter-coupled-logic)-compatible static RAM which has pipelined architecture and circuit techniques providing 6.5-ns first access and 5-ns cycle operation for fully random read/write. Using an all-CMOS technology, this cycle, combined with the 32-bit data I/O (input/output) capability, offers data bandwidth as high as 6.46 Gb/s. The technology is 1.2- mu m n-well CMOS with 14-nm gate oxide, 0.5- mu m effective channel length, and three levels of metal. The chip features a pin-selectable 32- or 8-bit-wide data I/O interface, transition-rate-controlled data outputs, low standby power, and well-controlled di/dt. To achieve high-speed operation and maximum power distribution efficiency, the chip is partitioned into 32 4k subarrays, organized into four quadrants. Operation using a pipelined chain of self-resetting circuit macros, initiated by a single clock, is shown. Measured waveforms are presented which illustrate the 6.5-ns access time and the 5-ns cycle time for a read ´1´ followed by a read ´0´ operation on the same data pin.<>
Keywords :
CMOS integrated circuits; emitter-coupled logic; integrated memory circuits; memory architecture; random-access storage; 1.2 micron; 128 kbit; 32-bit data I/O; 5 ns; 6.46 Gbit/s; 6.5 ns; CMOS ECL static RAM; access time; all-CMOS technology; chip partitioning; cycle time; data bandwidth; fully random read/write; high-speed operation; n-well CMOS; pipelined architecture; power distribution efficiency; self-resetting circuit macros; standby power; transition-rate-controlled data outputs; waveforms; Bandwidth; CMOS technology; Clocks; Decoding; Delay; Differential amplifiers; Driver circuits; Random access memory; Signal generators; Signal resolution;
Conference_Titel :
Solid-State Circuits Conference, 1989. Digest of Technical Papers. 36th ISSCC., 1989 IEEE International
Conference_Location :
New York, NY, USA
DOI :
10.1109/ISSCC.1989.48220