Title :
Three-dimensional nanoimprint using a mold made by focused-ion-beam chemical-vapor-deposition
Author :
Morita, T. ; Kometani, R. ; Watanabe, K. ; Kanda, K. ; Haruyama, Y. ; Kaito, T. ; Fujita, J. ; Ishida, M. ; Ochiai, Y. ; Matsui, S.
Author_Institution :
LASTI, Himeji Inst. of Technol., Hyogo, Japan
Abstract :
Nanoimprint lithography (NIL) is a very useful technique by which the fabrication of various nanostructure devices. A conventional mold is delineated by EB lithography and dry etching which has usually two-dimensional (2-D) patterns. 3-D structures are required in various devices such as optical devices (micro-lenses, photonic crystals, etc.). FIB-CVD is very useful to fabricate 3-D structures, as we previously demonstrated with several 3-D nanostructures. Moreover, a very large Young´s modulus over 600 GPa were confirmed by observation of diamond-like carbon (DLC) pillar mechanical vibration. These characteristics are advantageous to make 3-D mold. In this paper, we will report 3-D NIL using DLC mold by FIB-CVD. We used a commercial available FIB system (SMI9200: Seiko Instruments Inc.); a 30-keV beam of Ga ions was focused on the substrate, which was in a precursor ambient. We used phenanthrene (C/sub 14/H/sub 10/) as the source gas for the amorphous DLC growth.
Keywords :
CVD coatings; electron beam lithography; focused ion beam technology; nanolithography; 30 keV; C; Ga; focused-ion-beam chemical-vapor-deposition; mold; phenanthrene; three-dimensional nanoimprint lithography; Chemicals; Diamond-like carbon; Dry etching; Lithography; Nanolithography; Nanoscale devices; Optical device fabrication; Optical devices; Photonic crystals; Two dimensional displays;
Conference_Titel :
Microprocesses and Nanotechnology Conference, 2002. Digest of Papers. Microprocesses and Nanotechnology 2002. 2002 International
Conference_Location :
Tokyo, Japan
Print_ISBN :
4-89114-031-3
DOI :
10.1109/IMNC.2002.1178591