DocumentCode
3165108
Title
Constitutive behaviour of lead-free solders vs. lead-containing solders-experiments on bulk specimens and flip-chip joints
Author
Wiese, S. ; Schubert, A. ; Walter, H. ; Dukek, R. ; Feustel, F. ; Meusel, E. ; Michel, B.
Author_Institution
Semicond. & Microsystems Technol. Lab., Tech. Univ. Dresden, Germany
fYear
2001
fDate
2001
Firstpage
890
Lastpage
902
Abstract
Both high Pb-Sn and eutectic 63Sn-37Pb have been the suitable materials for the interconnection of electronic components because of their low cost and appropriate physical properties. Due to environmental awareness, and the health hazards caused by the lead in the solders, large efforts have been made to develop a lead-free soldering technology. Among the large variety of lead-free solders the Sn-Ag alloys are expected to be the best candidates. Furthermore, from a reliability point of view, there has been interest in the improved thermal fatigue resistance of solder interconnects. Therefore, in this study two lead-free solder alloys (Sn96.5Ag3.5, Sn95.5Ag3.8Cu0.7) and two lead-containing solder alloys(Sn63Pb37 Sn59Pb40Agl) were investigated and compared with each other in order to give an estimation of the reliability enhancement of the new lead-free soldering technology. These investigations were focused on mechanical and physical properties (coefficient of thermal expansion, stress-strain curves at different strain-rates, ultimate strength) as well as on the microstructural appearance of the solders
Keywords
circuit reliability; copper alloys; environmental factors; flip-chip devices; reflow soldering; silver alloys; thermal expansion; thermal stress cracking; tin alloys; SnAg; SnAgCu; bulk specimens; coefficient of thermal expansion; environmental awareness; flip-chip joints; health hazards; lead-free solders; reliability; stress-strain curves; thermal fatigue resistance; ultimate strength; Costs; Electronic components; Environmentally friendly manufacturing techniques; Fatigue; Hazards; Lead; Mechanical factors; Soldering; Thermal expansion; Thermal resistance;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference, 2001. Proceedings., 51st
Conference_Location
Orlando, FL
ISSN
0569-5503
Print_ISBN
0-7803-7038-4
Type
conf
DOI
10.1109/ECTC.2001.927900
Filename
927900
Link To Document