• DocumentCode
    3165108
  • Title

    Constitutive behaviour of lead-free solders vs. lead-containing solders-experiments on bulk specimens and flip-chip joints

  • Author

    Wiese, S. ; Schubert, A. ; Walter, H. ; Dukek, R. ; Feustel, F. ; Meusel, E. ; Michel, B.

  • Author_Institution
    Semicond. & Microsystems Technol. Lab., Tech. Univ. Dresden, Germany
  • fYear
    2001
  • fDate
    2001
  • Firstpage
    890
  • Lastpage
    902
  • Abstract
    Both high Pb-Sn and eutectic 63Sn-37Pb have been the suitable materials for the interconnection of electronic components because of their low cost and appropriate physical properties. Due to environmental awareness, and the health hazards caused by the lead in the solders, large efforts have been made to develop a lead-free soldering technology. Among the large variety of lead-free solders the Sn-Ag alloys are expected to be the best candidates. Furthermore, from a reliability point of view, there has been interest in the improved thermal fatigue resistance of solder interconnects. Therefore, in this study two lead-free solder alloys (Sn96.5Ag3.5, Sn95.5Ag3.8Cu0.7) and two lead-containing solder alloys(Sn63Pb37 Sn59Pb40Agl) were investigated and compared with each other in order to give an estimation of the reliability enhancement of the new lead-free soldering technology. These investigations were focused on mechanical and physical properties (coefficient of thermal expansion, stress-strain curves at different strain-rates, ultimate strength) as well as on the microstructural appearance of the solders
  • Keywords
    circuit reliability; copper alloys; environmental factors; flip-chip devices; reflow soldering; silver alloys; thermal expansion; thermal stress cracking; tin alloys; SnAg; SnAgCu; bulk specimens; coefficient of thermal expansion; environmental awareness; flip-chip joints; health hazards; lead-free solders; reliability; stress-strain curves; thermal fatigue resistance; ultimate strength; Costs; Electronic components; Environmentally friendly manufacturing techniques; Fatigue; Hazards; Lead; Mechanical factors; Soldering; Thermal expansion; Thermal resistance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 2001. Proceedings., 51st
  • Conference_Location
    Orlando, FL
  • ISSN
    0569-5503
  • Print_ISBN
    0-7803-7038-4
  • Type

    conf

  • DOI
    10.1109/ECTC.2001.927900
  • Filename
    927900