• DocumentCode
    3165135
  • Title

    An 8 ns BiCMOS 1 Mb ECL SRAM with a configurable memory array size

  • Author

    Tran, H. ; Fung, K. ; Bell, D. ; Chapman, R. ; Harward, M. ; Suzuki, T. ; Havemann, R. ; Eklund, R. ; Fleck, R. ; Le, D. ; Wei, C. ; Iyengar, N. ; Rodder, M. ; Haken, R. ; Scott, D.

  • Author_Institution
    Texas Instrum. Inc., Dallas, TX, USA
  • fYear
    1989
  • fDate
    15-17 Feb. 1989
  • Firstpage
    36
  • Lastpage
    37
  • Abstract
    A 1-Mb*1 BiCMOS ECL (emitter-coupled-logic) I/O SRAM (static random access memory) is fabricated using a 0.8- mu m BiCMOS process. This memory device utilizes a 76- mu m/sup 2/ full-CMOS six-transistor memory cell, a dual-MOS current-source BiCMOS bit line sensing scheme, a BiCMOS current-source voltage reference network, and a low-capacitance load block line decoding circuit to achieve 8-ns access time. The configurable memory array size architecture allows for memory sizes from 64 kb up to 1 Mb in 64 kb increments with no change in the peripheral circuits. The six-transistor cell layout is shown, and the memory block architecture is illustrated. The low dependence of power supply current on the operating frequency shows the impact of ECL circuits in the design. Characteristics of the SRAM are summarized.<>
  • Keywords
    BIMOS integrated circuits; emitter-coupled logic; integrated memory circuits; memory architecture; random-access storage; 0.8 micron; 1 Mbit; 8 ns; BiCMOS ECL I/O SRAM; BiCMOS current-source voltage reference network; access time; configurable memory array size; dual-MOS current-source BiCMOS bit line sensing scheme; full-CMOS six-transistor memory cell; low-capacitance load block line decoding circuit; memory block architecture; operating frequency; power supply current; static random access memory; BiCMOS integrated circuits; CMOS logic circuits; Decoding; Delay effects; Instruments; Integrated circuit interconnections; Power supplies; Process design; Random access memory; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference, 1989. Digest of Technical Papers. 36th ISSCC., 1989 IEEE International
  • Conference_Location
    New York, NY, USA
  • Type

    conf

  • DOI
    10.1109/ISSCC.1989.48223
  • Filename
    48223