DocumentCode :
3165146
Title :
Most-Surely vs. Least-Surely Uncertain
Author :
Sharma, Mukesh ; Bilgic, Mustafa
Author_Institution :
Comput. Sci. Dept., Illinois Inst. of Technol., Chicago, IL, USA
fYear :
2013
fDate :
7-10 Dec. 2013
Firstpage :
667
Lastpage :
676
Abstract :
Active learning methods aim to choose the most informative instances to effectively learn a good classifier. Uncertainty sampling, arguably the most frequently utilized active learning strategy, selects instances which are uncertain according to the model. In this paper, we propose a framework that distinguishes between two types of uncertainties: a model is uncertain about an instance due to strong and conflicting evidence (most-surely uncertain) vs. a model is uncertain about an instance because it does not have conclusive evidence (least-surely uncertain). We show that making a distinction between these uncertainties makes a huge difference to the performance of active learning. We provide a mathematical formulation to distinguish between these uncertainties for naive Bayes, logistic regression and support vector machines and empirically evaluate our methods on several real-world datasets.
Keywords :
Bayes methods; learning (artificial intelligence); pattern classification; regression analysis; support vector machines; uncertain systems; active learning method; active learning strategy; least-surely uncertain; logistic regression; mathematical formulation; most-surely uncertain; naive Bayes method; real-world datasets; support vector machines; uncertainty sampling; Equations; Learning systems; Logistics; Mathematical model; Measurement uncertainty; Support vector machines; Uncertainty; Active learning; uncertainty sampling;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Data Mining (ICDM), 2013 IEEE 13th International Conference on
Conference_Location :
Dallas, TX
ISSN :
1550-4786
Type :
conf
DOI :
10.1109/ICDM.2013.15
Filename :
6729551
Link To Document :
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