DocumentCode :
3165274
Title :
Observation of on-chip electrophoresis microcapillary using confocal laser scanning microscopy
Author :
Etoh, S. ; Fujimura, T. ; Hattori, R. ; Kuroki, Y.
Author_Institution :
Graduate Sch. of Inf. Sci & Electr. Eng.., Kyushu Univ., Japan
fYear :
2002
fDate :
6-8 Nov. 2002
Firstpage :
172
Lastpage :
173
Abstract :
In a capillary electrophoresis separation performance is affected by various factors, for example, an electroosmotic flow, dispersion of sample plug and sample adsorption to capillary wall. In order to miniaturize the microcapillary onto a chip we have to understand them in detail and investigate their influence. Confocal Laser Scanning Microscopy (CLSM) in fluorescence mode (FV300 Fluoview OLYMPUS JAPAN CO., LTD, Japan) was used to observe the motion of the samples in microcapillary fabricated on a chip. The CLSM is a powerful tool to understand their influence since it can capture the fluorescence images sliced in the plane perpendicular to the optical axis and can scan the plane position along the optical axis. Therefore it makes possible to observe the sample behavior inside the channel. This study also contributes the investigation of the microfluidic manipulation which includes a micropump, a microvalve and other microfluidic actuator devices under electrokinetic driven conditions.
Keywords :
capillarity; electrophoresis; microfluidics; optical microscopy; capillary wall; confocal laser scanning microscopy; dispersion; electrokinetic driven conditions; electroosmotic flow; fluorescence mode; microfluidic actuator devices; microfluidic manipulation; micropump; microvalve; on-chip electrophoresis microcapillary; sample adsorption; sample plug; Electrokinetics; Fluorescence; Glass; Laser theory; Microfluidics; Microscopy; Plugs; Shape; Surface treatment; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microprocesses and Nanotechnology Conference, 2002. Digest of Papers. Microprocesses and Nanotechnology 2002. 2002 International
Conference_Location :
Tokyo, Japan
Print_ISBN :
4-89114-031-3
Type :
conf
DOI :
10.1109/IMNC.2002.1178599
Filename :
1178599
Link To Document :
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