DocumentCode :
3165350
Title :
Robust Control for Linear Stages in Electronic Manufacturing
Author :
Quintanilla, Rafael ; Wen, John T. ; Arcak, Murat ; Frankel, Joe ; Peeples, Mark ; Unrath, Mark
Author_Institution :
Rensselaer Polytech. Inst., Troy
fYear :
2007
fDate :
9-13 July 2007
Firstpage :
1269
Lastpage :
1274
Abstract :
This paper considers the control of an x-y linear stage commonly used in electronic manufacturing. The challenge of the control problem includes coupled and nonlinear dynamics, flexibility due to the air bearing dynamics, geometric nonlinearity due to the interferometer position measurement, and tight cross-axis positioning requirements. We evaluate two control design approaches: robust control and gain scheduling. For the robust controller, a nominal linear time invariant design model is chosen with nonlinear dynamics considered as uncertainties. The choice of uncertainty characterization and weighting functions significantly affect the performance of the controller. For the gain scheduling controller design, robust controllers based on linearized models at several operating points within the workspace are combined. From the nonlinear simulation, it is shown that with suitable tuning, good performance is obtained throughout the work volume.
Keywords :
control system synthesis; electronics industry; geometry; linear systems; nonlinear dynamical systems; robust control; scheduling; air bearing dynamics; control design approaches; electronic manufacturing; gain scheduling; geometric nonlinearity; interferometer position measurement; linear stages; nominal linear time invariant design model; nonlinear dynamics; robust control; tight cross-axis positioning requirements; uncertainty characterization; weighting functions; Couplings; Hydraulic actuators; Job shop scheduling; Laser feedback; Manufacturing; Mirrors; Motion control; Nonlinear dynamical systems; Position measurement; Robust control;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
American Control Conference, 2007. ACC '07
Conference_Location :
New York, NY
ISSN :
0743-1619
Print_ISBN :
1-4244-0988-8
Electronic_ISBN :
0743-1619
Type :
conf
DOI :
10.1109/ACC.2007.4282545
Filename :
4282545
Link To Document :
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