DocumentCode
3165583
Title
MOS-IC Process And Device Characterization Within Philips
Author
Swaving, Sieger ; Ketting, Alfred ; Trip, Albert
Author_Institution
PHILIPS Research Laboratories
fYear
1988
fDate
22-23 Feb. 1988
Firstpage
180
Lastpage
184
Keywords
Automatic testing; Bonding; Integrated circuit testing; Laboratories; Libraries; Phase change materials; Process control; Production; Research and development; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Microelectronic Test Structures, 1988. ICMTS. Proceedings of the 1988 IEEE International Conference on
Conference_Location
Long Beach, CA, USA
Type
conf
DOI
10.1109/ICMTS.1988.672957
Filename
672957
Link To Document