Title :
Bump-less interconnect for next generation system packaging
Author :
Suga, Tadaotomo ; Otsuka, Kanji
Author_Institution :
Res. Center for Sci. & Technol., Tokyo Univ., Japan
Abstract :
A concept of bump-less interconnect for the next generation system packaging was proposed previously. Here the bump-less interconnect is defined as an interconnect of a size below 10 μm pitch between chip and substrate, or between chip and chip. Such ultra-fine pitch interconnection will be necessary to realize high speed systems such as chip on chip or 3-D configuration for highly integrated multi-chip system in packaging. Two requirements are considered: Firstly, a transmission structure called stacked-pair line will be adopted in the bus-line in boards, and secondly, the surface activated bonding, SAB, is used to enable such ultra-high dense interconnection. A model, which is called IMSI-model 2000, is presented as an example of high speed CPU-memory
Keywords :
fine-pitch technology; integrated circuit bonding; integrated circuit interconnections; integrated circuit packaging; multichip modules; 3D multi-chip system; IMSI-model 2000; bump-less interconnect; bus-line; chip-on-chip system; high-speed CPU memory; next generation system packaging; stacked-pair line; surface activated bonding; transmission structure; ultra-fine-pitch technology; Bonding; Delay effects; Electrodes; Electronic packaging thermal management; Electronics packaging; Fabrication; Semiconductor device packaging; System-on-a-chip; Transmission lines; Wiring;
Conference_Titel :
Electronic Components and Technology Conference, 2001. Proceedings., 51st
Conference_Location :
Orlando, FL
Print_ISBN :
0-7803-7038-4
DOI :
10.1109/ECTC.2001.927933