Title :
Flip chip in leaded molded package (FLMP)
Author :
Joshi, R. ; Manatad, R. ; Tangpuz, C.
Author_Institution :
Fairchild Semicond. Corp., San Jose, CA, USA
Abstract :
In the semiconductor industry, reducing the size of power electronics has been limited by the thermal performance of miniature surface mount packages. A key development in the industry has been the availability of more efficient silicon, allowing a lower on resistance die (RDS(ON)) to fit in a smaller package. However new innovative surface mount packages such as the MOSFET BGA package which combine the small form factors of miniature packages with the thermal performance of much larger packages have been developed. These new packages have the added advantage of virtually eliminating the package resistance. However packages which involve the BGA form factor require different handling equipment as compared to leaded surface mount devices, slowing their adoption rate. In the flip chip in a leaded molded package (FLMP), these shortcomings have been addressed preserving the advantages of miniature packages such as the MOSFET BGA package. A die up to 75% larger in area as compared to its wire bonded counterpart with estimated θjc of <0.5°C/W are typical characteristics of this package. Packages of a low profile (<1.0 mm height) can also be easily constructed due to the absence of wire bonds. In addition, the construction of the package lends itself well to a “lead free” or a green package. The paper will describe the construction of the package, the process flow, the performance and early reliability results
Keywords :
flip-chip devices; integrated circuit packaging; surface mount technology; FLMP; flip-chip in leaded molded package; form factor; on-resistance; surface mount package; Electronic packaging thermal management; Electronics industry; Flip chip; MOSFET circuits; Packaging machines; Power electronics; Semiconductor device packaging; Surface fitting; Surface resistance; Wire;
Conference_Titel :
Electronic Components and Technology Conference, 2001. Proceedings., 51st
Conference_Location :
Orlando, FL
Print_ISBN :
0-7803-7038-4
DOI :
10.1109/ECTC.2001.927934