• DocumentCode
    3165691
  • Title

    An efficient approach to computation of rain attenuation with consideration of multiple scattering

  • Author

    Setijadi, Eko ; Matsushima, Akira ; Tanaka, Naoki ; Hendrantoro, Gamantyo

  • Author_Institution
    Grad. Sch. of Sci. & Technol., Kumamoto Univ., Kumamoto, Japan
  • fYear
    2009
  • fDate
    7-10 Dec. 2009
  • Firstpage
    874
  • Lastpage
    877
  • Abstract
    The present paper numerically clarifies the degree of multiple scattering effects, which has been believed to become significant at high frequencies more than several hundred gigahertz. The specific rain attenuation is evaluated directly from an extinction cross section of dielectric spheres. A set of small dielectric spheres are randomly allocated inside a big fictitious sphere by using Weibull raindrop size distribution model. In order to take account of the multiple scattering among raindrops, we employ the mode matching method based on vector spherical wave functions and its addition theorem. Numerical results are demonstrated for the root mean square deviation of the specific attenuation between the cases with and without multiple scattering terms. Contrary to general belief, the deviation is the highest at around the boundary between microwave and millimeter wave bands.
  • Keywords
    Weibull distribution; atmospheric electromagnetic wave propagation; electromagnetic wave scattering; rain; wave functions; Weibull raindrop size distribution model; multiple scattering effects; rain attenuation computation; root mean square deviation; small dielectric spheres; vector spherical wave functions; wave propagation; Attenuation; Dielectrics; Electromagnetic fields; Electromagnetic scattering; Frequency; Mie scattering; Rain; Root mean square; Wave functions; Weibull distribution; Numerical analysis; Weibull distribution; wave propagation; wave scattering;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Conference, 2009. APMC 2009. Asia Pacific
  • Conference_Location
    Singapore
  • Print_ISBN
    978-1-4244-2801-4
  • Electronic_ISBN
    978-1-4244-2802-1
  • Type

    conf

  • DOI
    10.1109/APMC.2009.5384299
  • Filename
    5384299