Title :
Experimental and Theoretical Considerations on Evacuation of Vacuum Package for FED
Author :
Han, Jeong-In ; Kwak, Min-Gi ; Park, Yong-Kuy ; Lim, Sang-Cheul ; Lee, In-Kyu ; Cho, Kyong-Ik ; Yoo, Hyung-Joun
Author_Institution :
Korea Electronics Techonlogy Institute
Keywords :
Electron tubes; Electronics packaging; Glass; Heat pumps; Heating; Length measurement; Temperature; Time measurement; Vacuum systems; Vacuum technology;
Conference_Titel :
Vacuum Microelectronics Conference, 1997. Technical Digest., 1997 10th International
Conference_Location :
Kyongju, Korea
Print_ISBN :
0-7803-3786-7
DOI :
10.1109/IVMC.1997.627681