Title :
Calculation of Vacuum Conditions Inside a FED using a Monte-Carlo Method
Author :
Zoulkarneev, A.R. ; Park, N.S. ; Hong, J.P. ; Kim, J.M.
Author_Institution :
Samsung Advanced Institute of Technology
Keywords :
Computational modeling; Equations; Flat panel displays; Gases; Microstructure; Pressure measurement; Probability; Research and development; Vacuum technology; Volume measurement;
Conference_Titel :
Vacuum Microelectronics Conference, 1997. Technical Digest., 1997 10th International
Conference_Location :
Kyongju, Korea
Print_ISBN :
0-7803-3786-7
DOI :
10.1109/IVMC.1997.627683