DocumentCode :
316591
Title :
High Field Breakdown Characteristics of Micrometric Gaps in Vacuum
Author :
Ma, Xianyun ; Kim, J.D. ; Sudarshan, T.S.
Author_Institution :
Electrical and Computer Engineering Department, University of South Carolina
fYear :
1997
fDate :
17-21 Aug. 1997
Firstpage :
725
Lastpage :
729
Keywords :
Breakdown voltage; Dielectrics and electrical insulation; Electric breakdown; Electrodes; Flat panel displays; System testing; Temperature; Vacuum breakdown; Vacuum systems; Vacuum technology;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Vacuum Microelectronics Conference, 1997. Technical Digest., 1997 10th International
Conference_Location :
Kyongju, Korea
Print_ISBN :
0-7803-3786-7
Type :
conf
DOI :
10.1109/IVMC.1997.627685
Filename :
627685
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=316591
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