Title :
PCB inspection based on a variant of the n-tuple technique
Author :
Ouslim, M. ; Curtis, K.M.
Author_Institution :
Nottingham Univ., UK
Abstract :
Proposes an alternative approach based on a variant of the n-tuple technique to detect small defects in electronic printed circuit boards. The technique operates on a list of nine attributes formed in a 3 by 3 kernel. The comparison of corresponding frequencies of occurrence of these selected attributes recorded in the faulty and the fault-free images, provides an adequate means to categorize the defect. The results obtained during the study, show that the frequency distribution of the nine attributes gives an estimation of the size and shape of the faults. This suggests the use of this rapid technique in a preprocessing stage within a complete autonomous PCB inspection system
Keywords :
automatic optical inspection; electronic engineering computing; image classification; printed circuit testing; 3 by 3 kernel; PCB inspection; attributes; autonomous PCB inspection system; electronic printed circuit boards; fault-free images; frequencies; frequency distribution; n-tuple technique; preprocessing stage; shape; size; small defects;
Conference_Titel :
Image Processing and its Applications, 1995., Fifth International Conference on
Conference_Location :
Edinburgh
Print_ISBN :
0-85296-642-3
DOI :
10.1049/cp:19950745