• DocumentCode
    3166540
  • Title

    Scattering characteristics from conducting cylinder with reconstructing electromagnetic cloaking layers

  • Author

    Yao, Hai-Ying ; Qiu, Cheng-Wei ; Li, Le-Wei

  • Author_Institution
    Temasek Labs., Nat. Univ. of Singapore, Singapore, Singapore
  • fYear
    2009
  • fDate
    7-10 Dec. 2009
  • Firstpage
    960
  • Lastpage
    963
  • Abstract
    As we know, some anisotropic materials are difficult to be realized in the practical synthesis and applications. However, the previously reported optimized EM cloaking are homogeneous anisotropic layers. Moreover, the performance of the EM cloaking shell will be decreased if strictly requiring the optimized value of material parameters. In this paper, a material reconstruction method is used to resolve this problem. Here, a conducting cylindrical structure with multi-layered electromagnetic (EM) cloaking shell is studied. A set of optimized anisotropic material parameters for the cloaking is used to reconstruct the homogeneous isotropic cloaking layers with alternately arranging the two kinds of dielectrics. The corresponding parameters in the reconstruction, such as the thickness and the number of layers, are discussed. Moreover, the losses of influence and the sensitivity of the perturbation for material parameters are investigated.
  • Keywords
    anisotropic media; conducting bodies; invisibility cloaks; light scattering; multilayers; shells (structures); EM cloaking shell; conducting cylindrical structure; electromagnetic cloaking layers; homogeneous isotropic cloaking layers; material reconstruction method; multi-layered electromagnetic cloaking shell; optimized anisotropic material parameters; perturbation; Anisotropic magnetoresistance; Conducting materials; Dielectric materials; Eigenvalues and eigenfunctions; Electromagnetic scattering; Equations; Magnetic fields; Magnetic materials; Nonhomogeneous media; Permittivity; electromagnetic cloaking; isotropic materials; losses; multilayer; scattering cross section; sensitivity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Conference, 2009. APMC 2009. Asia Pacific
  • Conference_Location
    Singapore
  • Print_ISBN
    978-1-4244-2801-4
  • Electronic_ISBN
    978-1-4244-2802-1
  • Type

    conf

  • DOI
    10.1109/APMC.2009.5384332
  • Filename
    5384332