• DocumentCode
    3166669
  • Title

    BGA backplane connector for high speed differential signals

  • Author

    Olson, Stan W.

  • Author_Institution
    FCI Electron., Etters, PA, USA
  • fYear
    2001
  • fDate
    2001
  • Firstpage
    1233
  • Lastpage
    1238
  • Abstract
    The effort to achieve data-rates of 5 Gigabits/second and beyond is compromised by the relatively large plated-through holes (PTHs) required for conventional through hole connectors. The PTHs introduce impedance discontinuities that result in signal reflections. Additionally, the PTHs restrict the widths of the traces resulting in higher conductor losses. Increased bandwidth can be achieved by replacing conventional through-hole connectors with surface mount connectors using ball grid array attachment techniques. The elimination of the PTHs and substitution of smaller vias result in lowered impedance discontinuities and the ability to use wider traces. However, the ball grid array method of attachment has not, up to now, been used in backpanel systems. This paper discusses the approach to developing a BGA header for high-speed backpanel applications. Using a high volume BGA connector as a test vehicle, testing was initiated that simulated conditions found in backpanel applications. The test vehicle was incrementally loaded with weights that simulated the loading of a backpanel style connector until the limits of ball support were reached. The importance of level loading of the Ball Grid Array structure was established. Alternative methods of mechanical attachments were also explored. Finally, based on these findings, a prototype design was tooled that successfully passed accelerated life testing including thermal cycling and high temperature life
  • Keywords
    ball grid arrays; electric connectors; life testing; printed circuit accessories; surface mount technology; wiring; BGA backplane connector; accelerated life testing; ball grid array attachment techniques; conductor losses; high speed differential signals; high temperature life; impedance discontinuities; level loading; mechanical attachments; plated-through holes; surface mount connectors; test vehicle; Backplanes; Bandwidth; Conductors; Connectors; Electronics packaging; Prototypes; Reflection; Surface impedance; Testing; Vehicles;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 2001. Proceedings., 51st
  • Conference_Location
    Orlando, FL
  • ISSN
    0569-5503
  • Print_ISBN
    0-7803-7038-4
  • Type

    conf

  • DOI
    10.1109/ECTC.2001.927986
  • Filename
    927986