DocumentCode :
3166745
Title :
Variability and power management in sub-100nm SOI technology for reliable high performance systems
Author :
Das, Koushik ; Bernstein, Kerry ; Burns, Jeff ; Gebara, Fadi ; Lo, Shih-Hsien ; Nowka, Kevin ; Rao, Rahul ; Rosenfield, Michael
Author_Institution :
IBM Res. Div., Yorktown Heights, NY
fYear :
2008
fDate :
6-9 Oct. 2008
Firstpage :
1
Lastpage :
4
Abstract :
The ability to fully leverage future CMOS technologies will require a proactive approach to aggressively manage power while characterizing and mitigating the various sources of technology uncertainty. Adaptive techniques that span the full design stack across technology, circuits, and systems/software are required for building future reliable systems. Moreover, the emerging trend of low-power, multi-core-based systems requires very high transistor density and will help drive the transition to unconventional non-planar silicon devices with reduced short channel effects. An integrated design approach between technology development, VLSI design, design automation tools, and micro-architecture is required for optimum system design.
Keywords :
CMOS integrated circuits; VLSI; electronic design automation; integrated circuit design; integrated circuit reliability; integrated circuit technology; silicon-on-insulator; SOI technology; VLSI design; adaptive techniques; design automation tools; microarchitecture; multicore-based systems; nonplanar silicon devices; optimum system design; power management; proactive approach; reliable systems; short channel effects; stack across technology; transistor density; Buildings; CMOS technology; Energy management; Integrated circuit reliability; Integrated circuit technology; Power system management; Power system reliability; Software systems; Technology management; Uncertainty;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
SOI Conference, 2008. SOI. IEEE International
Conference_Location :
New Paltz, NY
ISSN :
1078-621X
Print_ISBN :
978-1-4244-1954-8
Electronic_ISBN :
1078-621X
Type :
conf
DOI :
10.1109/SOI.2008.4656268
Filename :
4656268
Link To Document :
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