DocumentCode :
3166796
Title :
Geometrical demonstration of the VSWR-locus in different reference planes and its applications
Author :
Pinarello, S. ; Mueller, J.E. ; Weigel, R.
Author_Institution :
Infineon Technol. AG, Neubiberg, Germany
fYear :
2009
fDate :
7-10 Dec. 2009
Firstpage :
1635
Lastpage :
1638
Abstract :
When evaluating the RF robustness of a power amplifier test measurements are performed on a locus of load conditions with constant voltage standing wave ratio (VSWR). The reference plane is normally set at the antenna input terminal where this constant VSWR locus of points represented on a Smith chart is a circle centred on the origin: often 50 Ohm. For design and technology purposes this investigation is performed via on wafer measurement at the transistor level, before the matching network. This implies that a different locus has to be chosen. Previous literature approaches this issue in a purely algebraical way which formulates the relationship between this two loci but leaves peculiar properties of the transformation unrevealed and unused. In this paper the problem is geometrically tackled and solved by reasoning on the nature of the loci and on the properties of the functions involved. The geometrical procedure is then arithmetically formalised as a linear system of equations whose solutions are compared with those of the classical approach. This comparison lead to discover an imprecision in the formulas previously published. The geometrical reasoning reveals a set of peculiar solutions which are traced back to conditions on the S-parameters of the matching network. The outcome of this proof is suitable for a software implementation and can be applied to an automated load-pull measurement set-up.
Keywords :
S-parameters; antennas; mobile communication; power amplifiers; transistors; S-parameters; Smith chart; VSWR-locus; antenna input terminal; load-pull measurement set-up; matching network; power amplifier test measurements; software implementation; transistor level; voltage standing wave ratio; wafer measurement; Antenna measurements; Linear systems; Performance evaluation; Power amplifiers; Power measurement; Radio frequency; Radiofrequency amplifiers; Robustness; Testing; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Conference, 2009. APMC 2009. Asia Pacific
Conference_Location :
Singapore
Print_ISBN :
978-1-4244-2801-4
Electronic_ISBN :
978-1-4244-2802-1
Type :
conf
DOI :
10.1109/APMC.2009.5384345
Filename :
5384345
Link To Document :
بازگشت