DocumentCode :
3166865
Title :
Self alignment technology between microlens focal points and near-field optical nano-probe apertures in 2-D micro-optical disk head
Author :
Goto, K. ; Kurihara, K. ; Suzuki, K. ; Nikolov, I.
Author_Institution :
Sch. of High Technol. for Human Welfare, Tokai Univ., Shizuoka, Japan
fYear :
2002
fDate :
6-8 Nov. 2002
Firstpage :
310
Lastpage :
311
Abstract :
A new optical memory system is urgently required to realize larger memory capacity and faster data transfer rate for the coming higher speed internet er-a. To overcome the current capacity barrier and the current low data transfer rate barrier in the far-field optical techniques, a novel near-field optical memory of super-parallel evanescent waves has been proposed and is being developed using a vertical cavity surface emitting laser (VCSEL) probe array, which consists of the VCSEL array as a light source and the GaP probe 2D array as the evanescent wave efficient generator. Fabrication and estimation of higher optical throughput for GaP probe array are described with 1.25% high throughput efficiency adopting a newly developed microlens array between the VCSEL output windows and the each GaP nano-probe in the array, where the focal points of each microlens inside the each semiconductor nano-probe are exactly coincident by the newly developed self-alignment technology. An array of up to 10,000 elements had been prepared successfully using the newly developed micro-fabrication processes, including the nano-photolithography, dry etching with ion milling and reactive ion etching processes, and the AR-coating deposition process to the high refractive index material surfaces.
Keywords :
III-V semiconductors; gallium compounds; microlenses; optical disc storage; optical transfer function; surface emitting lasers; 2-D micro-optical disk head; GaP; GaP probe array; VCSEL; antireflection coatings; dry etching; faster data transfer rate; high refractive index material surfaces; higher optical throughput; ion milling; larger memory capacity; microlens focal points; nano-photolithography; near-field optical memory; near-field optical nano-probe apertures; reactive ion etching; self alignment technology; super-parallel evanescent waves; vertical cavity surface emitting laser; Apertures; Lenses; Microoptics; Optical arrays; Optical refraction; Optical surface waves; Optical variables control; Probes; Stimulated emission; Vertical cavity surface emitting lasers;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microprocesses and Nanotechnology Conference, 2002. Digest of Papers. Microprocesses and Nanotechnology 2002. 2002 International
Conference_Location :
Tokyo, Japan
Print_ISBN :
4-89114-031-3
Type :
conf
DOI :
10.1109/IMNC.2002.1178667
Filename :
1178667
Link To Document :
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