• DocumentCode
    3167478
  • Title

    Pico-second signal transient characterization technique of meanders through s-parameter measurement in high-speed PWB interconnects

  • Author

    Kim, Yong-Ju ; Kim, Jo-Han ; Ryu, Hyo-Seog ; Suh, Young-Suk ; Wee, Jae-Kyung ; Chun, Heung-Sup ; Ki, Joong-Sik

  • Author_Institution
    Memory R&D Div., Hyundai Electron. Ind., Kyoungki, South Korea
  • fYear
    2001
  • fDate
    2001
  • Firstpage
    1463
  • Lastpage
    1467
  • Abstract
    In this paper, three s-parameter based techniques of meandering traces modeled on uniform transmission line model, optimized Π-network model, and the Cauer network synthesis technique, are presented to obtain time-domain responses using time domain circuit simulators as like SPICE. And the results of simulation are compared at operating frequencies of 100 MHz, 250 MHz, and 500 MHz, respectively. Model-dependant delay difference between the uniform transmission line model and optimized Π-network model at the frequency of 500 MHz is found to be about 32%. From these simulations, we can find that a selection of the proper model according to operating frequency on PWBs is important to obtain accurate signal integrity
  • Keywords
    S-parameters; SPICE; equivalent circuits; printed circuit design; time-domain analysis; transient analysis; transmission line theory; Π-equivalent circuit model; 100 MHz; 250 MHz; 500 MHz; Cauer network synthesis; S-parameter measurement; SPICE; design optimization; high-speed PWB interconnect; meander trace; picosecond signal transient; signal integrity; time delay; time-domain circuit simulation; uniform transmission line model; Circuit simulation; Circuit testing; Distributed parameter circuits; Frequency; Integrated circuit interconnections; Power system transients; SPICE; Scattering parameters; Time domain analysis; Time measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 2001. Proceedings., 51st
  • Conference_Location
    Orlando, FL
  • ISSN
    0569-5503
  • Print_ISBN
    0-7803-7038-4
  • Type

    conf

  • DOI
    10.1109/ECTC.2001.928029
  • Filename
    928029