Title :
Load-Pull Measurements Using Modulated Signals
Author :
Noori, B. ; Hart, P. ; Wood, J. ; Aaen, P.H. ; Guyonnet, M. ; Lefevre, M. ; Pla, J.A. ; Jones, J.
Author_Institution :
RF Div., Freescale Semicond. Inc., Tempe, AZ
Abstract :
In this paper we report a method of applying digitally modulated signals to an RF power transistor in a load-pull system. This methodology ensures that the transistor experiences realistic thermal conditions, as well as realistic electrical conditions during test. The measured data is then sliced at constant value of CCDF enabling meaningful performance comparisons to be made between devices and technologies
Keywords :
microwave power transistors; semiconductor device testing; CCDF; RF power transistor; digitally modulated signals; load pull measurements; Digital modulation; Electromagnetic heating; Peak to average power ratio; Power measurement; Pulse measurements; Pulse modulation; RF signals; Radio frequency; Radiofrequency amplifiers; Testing;
Conference_Titel :
Microwave Conference, 2006. 36th European
Conference_Location :
Manchester
Print_ISBN :
2-9600551-6-0
DOI :
10.1109/EUMC.2006.281404
