• DocumentCode
    3167659
  • Title

    Empirical risk minimization versus maximum-likelihood estimation: A case study

  • Author

    Meir, R.

  • Author_Institution
    Dept. of Electr. Eng., Technion-Israel Inst. of Technol., Haifa, Israel
  • Volume
    2
  • fYear
    1994
  • fDate
    9-13 Oct 1994
  • Firstpage
    295
  • Abstract
    Considers a simple two class pattern classification problem from two points of view, namely that of empirical risk minimization and that of maximum-likelihood estimation. The main focus is on an exact solution for the generalization error resulting from the above two approaches, emphasizing mainly the finite sample behavior, which is very different for the two methods. Focusing on the case of normal input distributions and linear threshold classifiers, the author uses statistical mechanics techniques to calculate the empirical and expected (or generalization) errors for the maximum-likelihood and minimal empirical error estimation methods, as well as several other algorithms. In the case of spherically symmetric distributions within each class the author finds that the simple Hebb rule, corresponding to maximum-likelihood parameter estimation, outperforms the other more complex algorithms, based on error minimization. Moreover, the author shows that in the regime where the overlap between the classes is large, algorithms with low empirical error do worse in terms of generalization, a phenomenon known as over-training
  • Keywords
    pattern classification; Hebb rule; empirical risk minimization; finite sample behavior; generalization error; linear threshold classifiers; maximum-likelihood estimation; minimal empirical error estimation methods; normal input distributions; over-training; spherically symmetric distributions; statistical mechanics; two class pattern classification problem; Computer aided software engineering; Convergence; Error analysis; H infinity control; Heart; Maximum likelihood estimation; Parameter estimation; Pattern recognition; Probability distribution; Risk management;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Pattern Recognition, 1994. Vol. 2 - Conference B: Computer Vision & Image Processing., Proceedings of the 12th IAPR International. Conference on
  • Conference_Location
    Jerusalem
  • Print_ISBN
    0-8186-6270-0
  • Type

    conf

  • DOI
    10.1109/ICPR.1994.576923
  • Filename
    576923