• DocumentCode
    3167664
  • Title

    A large signal model of the inverted InGaAs/InAlAs/InP HBT for harmonic distortion analysis

  • Author

    Li, Bin ; Prasad, Sheila ; Fu, TaoLing

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Northeastern Univ., Boston, MA, USA
  • fYear
    1995
  • fDate
    7-9 Aug 1995
  • Firstpage
    123
  • Lastpage
    131
  • Abstract
    A large signal equivalent circuit based on the Ebers-Moll model is developed for the InGaAs/InAlAs/InP collector-up HBT. The parasitic elements of the equivalent circuit are extracted at COLD (zero) bias by numerical optimization. An analytical approach is used to extract the intrinsic parameters of the small signal equivalent circuit at non-zero bias points. Appropriate equations given by device physics are fitted to the bias variation of intrinsic parameters so that the Ebers-Moll model parameters can be extracted. Harmonic distortion analysis is performed to verify the resulting HBT model. Excellent agreement between measurements and simulations is achieved at the fundamental and second harmonic frequencies. The agreement is not as good at the third harmonic frequency. This could be due to the fact that measurement inaccuracy exists in the lower drive level and the fmax of the device is very close to the third harmonic frequency
  • Keywords
    III-V semiconductors; aluminium compounds; equivalent circuits; gallium arsenide; harmonic distortion; heterojunction bipolar transistors; indium compounds; semiconductor device models; Ebers-Moll model; InGaAs-InAlAs-InP; collector-up HBT; harmonic distortion; inverted HBT; large signal equivalent circuit; numerical optimization; parasitic elements; simulation; Distortion measurement; Equations; Equivalent circuits; Frequency measurement; Heterojunction bipolar transistors; Indium compounds; Indium gallium arsenide; Indium phosphide; Physics; Signal analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    High Speed Semiconductor Devices and Circuits, 1995. Proceedings., IEEE/Cornell Conference on Advanced Concepts in
  • Conference_Location
    Ithaca, NY
  • ISSN
    1079-4700
  • Print_ISBN
    0-7803-3970-3
  • Type

    conf

  • DOI
    10.1109/CORNEL.1995.482427
  • Filename
    482427