Title :
Built-in temperature sensors for on-line thermal monitoring of microelectronic structures
Author :
Arabi, Karim ; Kaminska, Bozena
Author_Institution :
Opmaxx Inc., Beaverton, OR, USA
Abstract :
Built-in temperature sensors increase the system reliability by predicting eventual faults caused by excessive chip temperatures. In this paper, simple and efficient built-in temperature sensors for the on-line thermal monitoring of microelectronic structures are introduced. The proposed temperature sensors produce a signal oscillating at a frequency proportional to the temperature of the microelectronic structure and therefore they are compatible to the oscillation-test method. Design and detailed characteristics of the sensors proposed based on CMOS 1.2 μm technology parameters are presented. The fabrication results show a small spread in the nominal oscillation frequency of sensors implemented and a good sensitivity of the oscillation frequency with respect to temperature variations. The sensors proposed require very small power dissipation and silicon area
Keywords :
CMOS integrated circuits; integrated circuit testing; temperature measurement; temperature sensors; 1.2 micron; CMOS microelectronic structure; built-in temperature sensor; fabrication; fault detection; on-line thermal monitoring; oscillation frequency; power dissipation; reliability; silicon area; CMOS technology; Design methodology; Fabrication; Frequency; Microelectronics; Monitoring; Power dissipation; Reliability; Sensor phenomena and characterization; Temperature sensors;
Conference_Titel :
Computer Design: VLSI in Computers and Processors, 1997. ICCD '97. Proceedings., 1997 IEEE International Conference on
Conference_Location :
Austin, TX
Print_ISBN :
0-8186-8206-X
DOI :
10.1109/ICCD.1997.628909
