Title :
Behavioral EMI models of complex digital VLSI circuits
Author :
Steinecke, Thomas ; Koehne, Heiko ; Schmidt, Michael
Author_Institution :
Infineon Technol. AG, Muenchen, Germany
Abstract :
Increasing EMI potential of high-performance digital circuits like 32-bit microcontrollers demand for switching current models and feasible ways to run netlist-based EMI simulations. A promising modeling approach for digital VLSI circuits is presented and a silicon test vehicle for the correlation between models and measurements is described.
Keywords :
CMOS digital integrated circuits; VLSI; circuit simulation; digital integrated circuits; electromagnetic interference; elemental semiconductors; integrated circuit modelling; integrated circuit testing; microcontrollers; silicon; 32 bit; 32-bit microcontrollers; Si; behavioral EMI models; complex digital VLSI circuits; electromagnetic interference; high-performance digital circuits; netlist-based EMI simulations; silicon test vehicle; switching current models; Electromagnetic interference; Microcontrollers; Power supplies; Power system modeling; RLC circuits; Semiconductor device measurement; Semiconductor device modeling; Silicon; Testing; Very large scale integration;
Conference_Titel :
Electromagnetic Compatibility, 2003. EMC '03. 2003 IEEE International Symposium on
Print_ISBN :
0-7803-7779-6
DOI :
10.1109/ICSMC2.2003.1429040
