Title :
Analysis of a hybrid defect-tolerance scheme for high-density memory ICs
Author :
Koren, Israel ; Koren, Zahava
Author_Institution :
Dept. of Electr. & Comput. Eng., Massachusetts Univ., Amherst, MA, USA
Abstract :
Recent increases in the density and size of memory ICs made it necessary to search for new defect tolerance techniques since the traditional methods are no longer effective enough. Several new such schemes have been recently proposed and implemented. Due to the high complexity of these new techniques compared to the simple row and column redundancy, Monte-Carlo simulations were used to evaluate their yield enhancement. In this paper we present a yield analysis of one such new design and compare its yield to that of the traditional design
Keywords :
Monte Carlo methods; fault tolerant computing; integrated circuit reliability; integrated circuit yield; integrated memory circuits; redundancy; Monte Carlo simulation; high-density memory IC; hybrid defect tolerance; redundancy; yield; CMOS technology; Contracts; Costs; Driver circuits; Electronic mail; Fuses; Production; Random access memory; Redundancy; Silicon;
Conference_Titel :
Defect and Fault Tolerance in VLSI Systems, 1997. Proceedings., 1997 IEEE International Symposium on
Conference_Location :
Paris
Print_ISBN :
0-8186-8168-3
DOI :
10.1109/DFTVS.1997.628322
