Title :
Session #8 SOI radiation effects and RF applications
Author :
Iyer, Subu ; Vinet, Maud
Author_Institution :
IBM, USA
Keywords :
Aerospace engineering; Aerospace industry; CMOS technology; Circuits; Copper; Inductors; Laboratories; Radiation effects; Radio frequency; Temperature;
Conference_Titel :
SOI Conference, 2008. SOI. IEEE International
Conference_Location :
New Paltz, NY
Print_ISBN :
978-1-4244-1954-8
Electronic_ISBN :
1078-621X
DOI :
10.1109/SOI.2008.4656327
