DocumentCode
3168166
Title
Session #9 Device characterization, reliability, and modeling
Author
Trivedi, Vishal ; Ida, Jiro
Author_Institution
Freescale, USA
fYear
2008
fDate
6-9 Oct. 2008
Firstpage
141
Lastpage
142
Keywords
High K dielectric materials; High-K gate dielectrics; Immune system; MOSFET circuits; Passivation; Research and development; Semiconductor device modeling; Semiconductor diodes; Stress; Thyristors;
fLanguage
English
Publisher
ieee
Conference_Titel
SOI Conference, 2008. SOI. IEEE International
Conference_Location
New Paltz, NY
ISSN
1078-621X
Print_ISBN
978-1-4244-1954-8
Electronic_ISBN
1078-621X
Type
conf
DOI
10.1109/SOI.2008.4656334
Filename
4656334
Link To Document