• DocumentCode
    3168236
  • Title

    Liquid delivery CVD of PLZT thick films for electro-optic applications

  • Author

    Roeder, J.F. ; Bilodeau, S.M. ; Van Buskirk, P.C. ; Ozguz, V.H. ; Ma, J. ; Lee, S.H.

  • Author_Institution
    Adv. Technol. Mater., Danbury, CT, USA
  • fYear
    1991
  • fDate
    33457
  • Firstpage
    687
  • Lastpage
    690
  • Abstract
    PLZT films in the composition range 7/0/100-32/0/100 have been deposited by CVD from a single source reagent using a liquid delivery/flash vaporization approach. Single phase perovskite films ranging in thickness from 1-5 μm were deposited on fused silica substrates at 535°C. The films had very strong crystallographic texture with [100] normal to the plane of the film. Optical loss per unit thickness was lower for thicker films suggesting that interfacial effects dominated losses. Very large electro-optic effects were observed in a number of the films. Birefringent shifts were measured by phase retardation in transmission mode with an electric field applied in the plane of the film using interdigitated electrodes. Birefringent shift varied quadratically with applied field and showed little hysteresis with R coefficients as high as 5×10-16 (m/V)2. The strength of the electro-optic effect is attributed to the high degree of crystallinity of the films and the a-axis orientation
  • Keywords
    CVD coatings; birefringence; dielectric hysteresis; ferroelectric materials; ferroelectric thin films; interface phenomena; lanthanum compounds; lead compounds; optical losses; piezoceramics; texture; 1 to 5 mum; 535 C; PLZT; PLZT thick films; PbLaZrO3TiO3; a-axis orientation; birefringent shift; electro-optic applications; fused silica substrates; high degree of crystallinity; liquid delivery CVD; liquid delivery/flash vaporization approach; optical loss per unit thickness; single phase perovskite films; single source reagent; transmission mode; very large electro-optic effects; very strong crystallographic texture; Birefringence; Crystallography; Electric variables measurement; Electrodes; Optical films; Optical losses; Phase measurement; Silicon compounds; Substrates; Thick films;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Applications of Ferroelectrics, 1994.ISAF '94., Proceedings of the Ninth IEEE International Symposium on
  • Conference_Location
    University Park, PA
  • Print_ISBN
    0-7803-1847-1
  • Type

    conf

  • DOI
    10.1109/ISAF.1994.522461
  • Filename
    522461