Title :
Image position analysis of motion errors for missile-borne SAR based on diving model
Author :
Sun Bing ; Wang Ye ; Chen Jie ; Wang Yan ; Li Bing
Author_Institution :
Sch. of Electron. & Inf. Eng., Beihang Univ., Beijing, China
Abstract :
This paper concentrates on the synthetic aperture radar(SAR) image position analysis of the missile-borne SAR platform´s motion errors based on the general missile-borne SAR diving model. The general missile-borne diving model expanded from the classic side-look image model includes three-dimensional position and three-dimensional velocity and can be used describe the motion of the missile-borne SAR flexibly. Based on the general model and the Doppler position equations of SAR slant image to ground image, the two-dimensional position errors expressions of the corrected image are derived. The expressions are the functions of the platform´s three-dimensional position and three-dimensional velocity. Then the SAR image´s position errors varying with the above six factors are simulated, also the whole-chain simulation including echo simulation, imaging and position measuring validated the correction of the image position expressions. The presented position expressions of the platform´s motion errors can serve the platform´s parameters choosing for the missile-borne system design, and it is of important value for engineering reference.
Keywords :
airborne radar; image motion analysis; missiles; radar imaging; synthetic aperture radar; Doppler position equations; diving model; general missile-borne diving model; ground image; image position analysis; missile-borne SAR; motion errors; position nmeasurement; side-look image model; slant image; synthetic aperture radar image position analysis; three-dimensional position; three-dimensional velocity; two-dimensional position errors; Analytical models; Doppler effect; Imaging; Mathematical model; Radar imaging; Synthetic aperture radar; SAR; diving model; geometric correction; motion error; position;
Conference_Titel :
Imaging Systems and Techniques (IST), 2013 IEEE International Conference on
Conference_Location :
Beijing
Print_ISBN :
978-1-4673-5790-6
DOI :
10.1109/IST.2013.6729692