DocumentCode :
3168380
Title :
Compact K-band Watt-level GaAs PHEMT Power Amplifier MMIC with integrated ESD protection
Author :
Bessemoulin, A. ; McCulloch, M.G. ; Alexander, A. ; McCann, D. ; Mahon, S.J. ; Harvey, J.T.
Author_Institution :
Mimix Broadband Inc., Houston, TX
fYear :
2006
fDate :
10-15 Sept. 2006
Firstpage :
1743
Lastpage :
1746
Abstract :
The performance of a compact K-band power amplifier MMIC fabricated in standard 6-inch 0.15-mum GaAs power PHEMT technology is reported. The circuit features on-chip ESD protection including input short-circuit stub, dual capacitors at RF ports and high-current diode arrays on each gate pad. Occupying less than 3 mm2, this 3-stage power amplifier achieves a linear gain of more than 20 dB over the 17- to 24 GHz frequency range with 6-dB noise figure. It also delivers a CW output power of more than 29- and 30 dBm, in the 17-20 GHz band, at 5- and 6 V respectively. Preliminary ESD characterization shows the circuit withstands 180-V in human body model test (tester limit), and 100-V machine model (equivalent to at least 500-V HBM), without DC or RF performance degradation. Finally, performance in standard 24-lead plastic QFN package (4 times 4 mm2) is presented: the device exhibits more than 17.5-dB linear gain over 17-24 GHz, with P-1dB greater than 28-dBm in the 17.7-19.7 GHz radio range
Keywords :
HEMT integrated circuits; III-V semiconductors; MMIC power amplifiers; capacitors; diodes; electrostatic discharge; gallium arsenide; 0.15 micron; 100 V; 17 to 24 GHz; 180 V; 24-lead plastic QFN package; 3-stage power amplifier; 5 V; 6 V; 6 dB; 6 inches; GaAs; MMIC; RF ports; compact K-band Watt-level PHEMT power amplifier; dual capacitors; electrostatic discharge; gate pad; high-current diode arrays; human body model test; input short-circuit stub; integrated ESD protection; machine model; on-chip ESD protection; Circuit testing; Electrostatic discharge; Gallium arsenide; K-band; MMICs; PHEMTs; Power amplifiers; Protection; Radio frequency; Radiofrequency amplifiers;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Conference, 2006. 36th European
Conference_Location :
Manchester
Print_ISBN :
2-9600551-6-0
Type :
conf
DOI :
10.1109/EUMC.2006.281479
Filename :
4058188
Link To Document :
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