• DocumentCode
    3168405
  • Title

    Impact of back-gate biasing on ultra-thin silicon-on-insulator-based nanoribbon sensors

  • Author

    Fernandes, P.G. ; Chapman, R.A. ; Seitz, O. ; Stiegler, H.J. ; Wen, H.-C. ; Chabal, Y.J. ; Vogel, E.M.

  • Author_Institution
    Dept. Of Electr. Eng., Univ. of Texas at Dallas, Dallas, TX, USA
  • fYear
    2010
  • fDate
    11-14 Oct. 2010
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    For over 30 years, field effect transistors (FETs) have been used as ion sensors [1]. In the past, IonSensitive-FETs were based on bulk MOSFET designs and the reference electrode was used to bias the device [2]. Recently, functionalized silicon nanowires and nanoribbons have been used to detect a variety of species including proteins and single viruses [3-4]. These designs allow for gating of the device from the back, across the buried oxide of the wafer [3-4]. Careful consideration must be given to the interaction of the liquid media and coupling effects with the FET. This is paramount to the determination of the operating region of the sensor. In this work, we investigate the effects and advantages of applying a back gate bias on SOIFET-based chem-/biosensors. Further, we look at the different responses of dynamic and static DC measurements on pH and protein (biotin-streptavidin) sensors.
  • Keywords
    MOSFET; biosensors; chemical sensors; field effect transistors; nanosensors; nanowires; silicon; silicon-on-insulator; MOSFET; SOIFET; back gate bias; biosensors; chemical sensor; field effect transistors; ion sensors; nanoribbon sensors; pH sensors; protein sensors; silicon nanowires; ultra thin silicon-on-insulator; Couplings; FETs; Logic gates; Sensor phenomena and characterization; Silicon; Voltage measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    SOI Conference (SOI), 2010 IEEE International
  • Conference_Location
    San Diego, CA
  • ISSN
    1078-621x
  • Print_ISBN
    978-1-4244-9130-8
  • Electronic_ISBN
    1078-621x
  • Type

    conf

  • DOI
    10.1109/SOI.2010.5641066
  • Filename
    5641066