Title :
Cryogenic ultra low power CMOS
Author_Institution :
Dept. of Electr. Eng., Stanford Univ., CA, USA
Abstract :
This paper reports 7-stage 1.5 /spl mu/m zeroVt CMOS ring oscillators operating at 170 MHz/V down to V/sub dd/=70 mV at room temperature, and 360 MHz/V down to V/sub dd/=27 mV at 77 K.
Keywords :
CMOS integrated circuits; circuit optimisation; cryogenic electronics; integrated circuit design; integrated circuit testing; 1.5 mum; 27 to 70 mV; 330 mV; 77 to 295 K; CMOS ring oscillators; Stanford Flexible Baseline Process; cryogenic ULP; cryogenic ultra low power CMOS; energy efficiency; threshold voltage shifts; total energy minimization; CMOS technology; Cryogenics; Integrated circuit technology; Laboratories; Low voltage; Ring oscillators; Space technology; Temperature; Testing; Threshold voltage;
Conference_Titel :
Low Power Electronics, 1995., IEEE Symposium on
Conference_Location :
San Jose, CA, USA
Print_ISBN :
0-7803-3036-6
DOI :
10.1109/LPE.1995.482473