Title :
Automated system of hess screen for diagnosis of paralytic strabismus using computer aided diagnosis
Author :
Yamin, Abid ; Khan, Shoab Ahmed ; Yasin, Ubaid-Ullah
Author_Institution :
Dept. of Comput. Eng., Nat. Univ. of Sci. & Technol., Islamabad, Pakistan
Abstract :
In ophthalmology, Hess screen is an imperative instrument which is primarily employed for the measurement of paralytic strabismus. Strabismus is the state of eye in which eyes are not properly aligned with each other and patient complaint for double vision (diplopia). In this paper we propose a model for the automation of traditional Hess Screen instrument for the diagnosis of strabismus. Currently this system is totally manual in operate and consume lot of time of patient as well as ophthalmologist. We present a three stage system consisting of image acquisition, point extraction, plotting and computer aided diagnosis algorithm. First stage is composed of a digital camera which will take images of the HESS board and transfer it to a computer. In second stage image processing techniques are used to extract points from images to draw HESS plot, and in third stage an algorithm based on fuzzy logic is designed which will automatically diagnose the paralytic strabismus using statistics of the Hess graphs. This system is convenient, fast and has an ability to manage medical record with refinement. The evaluation of proposed system is performed by using dataset provided by well known local hospital.
Keywords :
eye; feature extraction; fuzzy logic; graph theory; health care; medical image processing; statistics; Hess graphs; Hess screen; automated system; computer aided diagnosis; diplopia; double vision; fuzzy logic; hospital; image acquisition; image processing; ophthalmology; paralytic strabismus; point extraction; statistics; Light emitting diodes; Medical diagnostic imaging; Universal Serial Bus; Hess screen; diplopia; fuzzy logic; image manipulation; opthalmology; paralytic strabismus;
Conference_Titel :
Imaging Systems and Techniques (IST), 2013 IEEE International Conference on
Conference_Location :
Beijing
Print_ISBN :
978-1-4673-5790-6
DOI :
10.1109/IST.2013.6729710