• DocumentCode
    3168803
  • Title

    A three-dimensional imaging system for surface profilometry of moving objects

  • Author

    Fuqin Deng ; Jianyang Liu ; Jiangwen Deng ; Fung, Kenneth S. M. ; Lam, Edmund Y.

  • Author_Institution
    Dept. of Electr. & Electron. Eng., Univ. of Hong Kong, Hong Kong, China
  • fYear
    2013
  • fDate
    22-23 Oct. 2013
  • Firstpage
    343
  • Lastpage
    347
  • Abstract
    Non-contact optical imaging system design and the corresponding surface profilometry algorithm are critical components in various metrology applications, such as surface inspection of semiconductor components on the production line. For such challenging industrial applications, the most important considerations are often automation, precision and speed of the inspection. In this work, we propose a mathematical framework and a dynamic phase-shift algorithm (D-PSA) for a dense surface profilometry of moving objects. We also present a fringe pattern projection system with projector and camera arrays, with an aim to reduce the undesirable effects such as the uneven illumination and the perspective geometry effect on the reconstructed surface using a large field-of-view inspection system. This system is then applied to the inspection of the surface of moving printed circuit boards along a conveyor belt. Experimental results show that our approach can reconstruct the object surface effectively and efficiently.
  • Keywords
    image reconstruction; inspection; nondestructive testing; optical instruments; production engineering computing; semiconductor device manufacture; surface reconstruction; camera arrays; conveyor belt; dynamic phase shift algorithm; fringe pattern projection system; metrology; moving printed circuit boards; noncontact optical imaging system; object reconstruction; semiconductor components; surface inspection; surface profilometry; surface reconstructed; three-dimensional imaging system; Cameras; Image reconstruction; Inspection; Optical imaging; Surface reconstruction; Surface treatment; industrial inspection; profilometry; surface measurement; three-dimensional image acquisition;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Imaging Systems and Techniques (IST), 2013 IEEE International Conference on
  • Conference_Location
    Beijing
  • Print_ISBN
    978-1-4673-5790-6
  • Type

    conf

  • DOI
    10.1109/IST.2013.6729718
  • Filename
    6729718