DocumentCode :
3168895
Title :
A BiCMOS channelless masterslice with on-chip voltage converter
Author :
Fukuda, Hideki ; Horiguchi, Shoji ; Urano, Masami ; Fukami, Kennosuke ; Matsuda, Kazuhiro ; Ohwada, Norihiko ; Akiya, Hideo
Author_Institution :
NTT, Atsugi, Japan
fYear :
1989
fDate :
15-17 Feb. 1989
Firstpage :
176
Lastpage :
177
Abstract :
An approach to solving reliability problems due to voltage tolerance in submicron devices is described which involves lowering the operating voltage using an on-chip voltage conversion system. The masterslice has an on-chip voltage converter, TLL-compatible I/O circuits and uses advanced 0.8- mu m BiCMOS technology. A cross-sectional view of the BiCMOS device, which consists of CMOS transistors with simple n-well structure and an n-p-n bipolar transistor, is shown. The masterslice has been applied to a digital signal processing circuit. The chip contains 20 k gates, including four multiplier macrocells and random logic circuits. In the random logic circuits, which consist of double-size transistors, the packing density is 240 gate/mm/sup 2/, and the average delay is 600 ps for a two-input NAND gate with FO=3 and 1-mm wiring length. In the multipliers, 660 gate/mm/sup 2/ packing density and 450 ps average delay for 2-input NAND gate with FO=3 are attained.<>
Keywords :
BIMOS integrated circuits; cellular arrays; circuit reliability; convertors; logic arrays; 0.8 micron; 450 ps; 600 ps; BiCMOS; CMOS transistors; TLL-compatible I/O circuits; average delay; channelless masterslice; digital signal processing circuit; multiplier macrocells; n-p-n bipolar transistor; n-well structure; on-chip voltage converter; onchip voltage conversion; random logic circuits; reliability problems; submicron devices; voltage tolerance; BiCMOS integrated circuits; Bipolar transistors; CMOS technology; Delay; Digital signal processing chips; Logic circuits; Macrocell networks; System-on-a-chip; Voltage; Wiring;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Circuits Conference, 1989. Digest of Technical Papers. 36th ISSCC., 1989 IEEE International
Conference_Location :
New York, NY, USA
Type :
conf
DOI :
10.1109/ISSCC.1989.48248
Filename :
48248
Link To Document :
بازگشت