DocumentCode :
3169152
Title :
A lunar landing safety estimation methodology using lidar acquired DEM
Author :
Shaochen Zhang ; Zhao Yan ; Falin Wu
Author_Institution :
Sch. of Instrum. Sci. & Opto-Electron. Eng., Beihang Univ., Beijing, China
fYear :
2013
fDate :
22-23 Oct. 2013
Firstpage :
419
Lastpage :
424
Abstract :
This paper presents a safety estimation methodology for soft landing explorations on the Moon. In our application we use digital elevation models (DEM) of given lunar terrain extracted from on-board lidars. Currently most landing safety analysis methods are based on topographical analysis which needs quite a lot of computation. Here we adopt a Monte-Carlo simulation method which doesn´t need to identify complex lunar topographical characteristics and needs less computation. After developing lunar lander´s collision detection model, lander gradient model, and lander aspect model, Monte-Carlo simulations of landing on given DEM are conducted iteratively. Safety estimation is implemented by analyzing corresponding simulation results using statistical analysis method. Simulation errors of this algorithm are also deduced and analyzed in this paper. Computer simulation results show that this method can provide valuable information to estimate landing safety of given terrain for lunar soft landing missions.
Keywords :
Monte Carlo methods; digital elevation models; entry, descent and landing (spacecraft); lunar surface; optical radar; planetary rovers; Monte-Carlo simulation method; complex lunar topographical characteristics; computer simulation; digital elevation models; lidar acquired DEM; lunar landing safety estimation methodology; safety estimation; statistical analysis method; topographical analysis; Computational modeling; Estimation; Mathematical model; Monte Carlo methods; Moon; Rocks; Safety; Monte-Carlo method; digital elevation models (DEM); landing safety; lidar; lunar terrain; simulation error;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Imaging Systems and Techniques (IST), 2013 IEEE International Conference on
Conference_Location :
Beijing
Print_ISBN :
978-1-4673-5790-6
Type :
conf
DOI :
10.1109/IST.2013.6729734
Filename :
6729734
Link To Document :
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