• DocumentCode
    3169175
  • Title

    A novel microwave staring imaging method based on short-time integral stochastic radiation fields

  • Author

    Yuanyue Guo ; Yuanpeng Ma ; Dongjin Wang

  • Author_Institution
    Dept. of Electron. Eng. & Inf. Sci., Univ. of Sci. & Technol. of China, Hefei, China
  • fYear
    2013
  • fDate
    22-23 Oct. 2013
  • Firstpage
    425
  • Lastpage
    430
  • Abstract
    For microwave staring correlated imaging method, high-precision requirement of time synchronization between stochastic radiation fields and scattered echo signals must be satisfied. In order to reduce its influence on microwave correlated imaging results, a novel microwave staring correlated imaging scheme is proposed based on short-time integral stochastic radiation fields. Then the short-time integral correlated imaging model on the intra-pulse stochastic radiation fields and intra-pulse scattered echoes is established, which improve its tolerance capability of time synchronization error of the imaging system, meanwhile, the temporal-spatial stochastic characteristics of short-time integral radiation field can be maintained as well as its super-resolution potential of microwave correlated imaging. Finally, the effectiveness of this imaging method is validated by the numerical simulations.
  • Keywords
    microwave imaging; numerical analysis; remote sensing; high precision time synchronization; intrapulse scattered echoes; intrapulse stochastic radiation fields; microwave staring correlated imaging method; scattered echo signals; short time integral stochastic radiation fields; superresolution microwave correlated imaging; temporal-spatial stochastic characteristics; Microwave imaging; Microwave theory and techniques; Radar imaging; Stochastic processes; Synchronization; correlated imaging; high-precision time synchronization; microwave staring imaging; short-time integral stochastic radiation fields;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Imaging Systems and Techniques (IST), 2013 IEEE International Conference on
  • Conference_Location
    Beijing
  • Print_ISBN
    978-1-4673-5790-6
  • Type

    conf

  • DOI
    10.1109/IST.2013.6729735
  • Filename
    6729735