Title :
Finite element method for the accurate analysis of delay line propagation characteristics
Author :
Topsakal, Erdem ; Volakis, John
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Michigan Univ., Ann Arbor, MI, USA
Abstract :
The finite element method (FEM) with tetrahedral elements has been applied to a meander delay line problem for determining propagation characteristics. S11 at the input port and the field variation right above the delay line are calculated and compared with reference data. The effects of meander line spacing and meander line length on the output voltage are also investigated. Results are obtained for various dielectric substrates having different thicknesses.
Keywords :
UHF antennas; copper; delay lines; dielectric materials; finite element analysis; microwave antennas; radio receivers; 3.5 GHz; Cu; delay line propagation properties; dielectric substrates; finite element method; meander delay line problem; meander line length; meander line spacing effect; tetrahedral elements; Copper; Coupling circuits; Delay lines; Dielectric substrates; Electromagnetic compatibility; Electromagnetic modeling; Equations; Finite element methods; Geometry; Printed circuits;
Conference_Titel :
Electromagnetic Compatibility, 2003. EMC '03. 2003 IEEE International Symposium on
Print_ISBN :
0-7803-7779-6
DOI :
10.1109/ICSMC2.2003.1429101
