Title :
Study of circuit sensitivity to interconnect variation
Author :
Lin, Yung-Tao ; Spanos, Costas ; Milor, Linda ; Yung-Tao Lin
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., California Univ., Berkeley, CA, USA
Abstract :
Deep submicron technology makes interconnect one of the main factors determining the circuit performance. Previous work shows that interconnect parameters exhibit a significant amount of spatial variation. In this work, we present a methodology to study the influence of the interconnect variation on circuit performance. Parameterized interconnect modeling technology is introduced, and a ring oscillator circuit with interconnect dominant loading is studied
Keywords :
SPICE; VLSI; circuit analysis computing; circuit optimisation; integrated circuit design; integrated circuit interconnections; integrated circuit modelling; sensitivity analysis; timing; circuit performance; circuit sensitivity; deep submicron technology; interconnect dominant loading; interconnect variation; parameterized interconnect modeling technology; ring oscillator circuit; spatial variation; Capacitance; Circuit optimization; Circuit simulation; Computational modeling; Curve fitting; Integrated circuit interconnections; Numerical simulation; Process design; Ring oscillators; Space technology;
Conference_Titel :
Statistical Metrology, 1997 2nd International Workshop on
Conference_Location :
Kyoto
Print_ISBN :
0-7803-3737-9
DOI :
10.1109/IWSTM.1997.629406
