Title :
Practical issues of interconnect analysis in deep submicron integrated circuits
Author_Institution :
IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA
Abstract :
In this paper, we review the algorithms and methodologies used for interconnect analysis in deep submicron integrated circuits. In particular, we examine the techniques that have been practically used for static timing and static noise analysis in the design of high-performance microprocessors. We also consider the technology and performance trends which are driving us toward more sophisticated algorithms and more complex analysis for interconnect
Keywords :
VLSI; microprocessor chips; timing; deep submicron integrated circuits; high-performance microprocessors; interconnect analysis; performance trends; static noise analysis; static timing; Coupling circuits; Delay effects; Equations; Inductance; Integrated circuit interconnections; Integrated circuit modeling; Integrated circuit noise; Load modeling; Taylor series; Timing;
Conference_Titel :
Computer Design: VLSI in Computers and Processors, 1997. ICCD '97. Proceedings., 1997 IEEE International Conference on
Conference_Location :
Austin, TX
Print_ISBN :
0-8186-8206-X
DOI :
10.1109/ICCD.1997.628918