DocumentCode :
3169762
Title :
Iterated function system as a model of chaos excitation in the electronic system with transmission line
Author :
Magda, I.I. ; Gorban, A.M. ; Paschenko, A.V. ; Shapoval, I.M. ; Novikov, V.E.
Author_Institution :
Nat. Sci. Center, Kharkov Inst. of Phys. & Technol., Ukraine
Volume :
2
fYear :
2003
fDate :
11-16 May 2003
Firstpage :
1136
Abstract :
Results of numerical modeling and experimental research indicate a possibility for radio-electronic device chaotization produced by ultra-short pulse (USP) interference, if the device (for given parameters of the external signal) can be considered as a transmission line (e.g., the device providing delay of a signal) coupled to nonlinear load. It is shown, that an effective model of similar phenomena is generalization of the mapping concept, iterated function system (IFS). Using the procedures developed by authors that rely on the adaptive testing concept (ATC), it is possible to recover the IFS producing the distribution of local Lyapunov exponents (or Jacobians of the mapping which are included in the IFS) to coincide with the distribution of the original experimental time series (TS). The recovered IFS allows to determine the effective current-voltage characteristic for electronic system based on the response TS processing.
Keywords :
chaos generators; electromagnetic interference; high-frequency transmission lines; iterative methods; radio receivers; time series; IFS; adaptive testing concept; chaos excitation; current-voltage characteristics; electronic system; iterated function system; local Lyapunov exponents; nonlinear load; numerical modeling; original experimental time series; radio electronic device chaotization; signal delay; transmission line; ultrashort pulse interference; Chaos; Delay effects; EMP radiation effects; Frequency; Interference; Numerical models; Pulse amplifiers; Testing; Transmission line theory; Transmission lines;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility, 2003. EMC '03. 2003 IEEE International Symposium on
Print_ISBN :
0-7803-7779-6
Type :
conf
DOI :
10.1109/ICSMC2.2003.1429117
Filename :
1429117
Link To Document :
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