• DocumentCode
    3169762
  • Title

    Iterated function system as a model of chaos excitation in the electronic system with transmission line

  • Author

    Magda, I.I. ; Gorban, A.M. ; Paschenko, A.V. ; Shapoval, I.M. ; Novikov, V.E.

  • Author_Institution
    Nat. Sci. Center, Kharkov Inst. of Phys. & Technol., Ukraine
  • Volume
    2
  • fYear
    2003
  • fDate
    11-16 May 2003
  • Firstpage
    1136
  • Abstract
    Results of numerical modeling and experimental research indicate a possibility for radio-electronic device chaotization produced by ultra-short pulse (USP) interference, if the device (for given parameters of the external signal) can be considered as a transmission line (e.g., the device providing delay of a signal) coupled to nonlinear load. It is shown, that an effective model of similar phenomena is generalization of the mapping concept, iterated function system (IFS). Using the procedures developed by authors that rely on the adaptive testing concept (ATC), it is possible to recover the IFS producing the distribution of local Lyapunov exponents (or Jacobians of the mapping which are included in the IFS) to coincide with the distribution of the original experimental time series (TS). The recovered IFS allows to determine the effective current-voltage characteristic for electronic system based on the response TS processing.
  • Keywords
    chaos generators; electromagnetic interference; high-frequency transmission lines; iterative methods; radio receivers; time series; IFS; adaptive testing concept; chaos excitation; current-voltage characteristics; electronic system; iterated function system; local Lyapunov exponents; nonlinear load; numerical modeling; original experimental time series; radio electronic device chaotization; signal delay; transmission line; ultrashort pulse interference; Chaos; Delay effects; EMP radiation effects; Frequency; Interference; Numerical models; Pulse amplifiers; Testing; Transmission line theory; Transmission lines;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility, 2003. EMC '03. 2003 IEEE International Symposium on
  • Print_ISBN
    0-7803-7779-6
  • Type

    conf

  • DOI
    10.1109/ICSMC2.2003.1429117
  • Filename
    1429117