Title :
Resonant-cavity avalanche photodiodes and narrow spectral response photodiodes
Author :
Murtaza, S.S. ; Anselm, K.A. ; Tan, I.H. ; Chelakara, R.V. ; Islam, M.R. ; Dupuis, R.D. ; Streetman, B.G. ; Bowers, J.E. ; Hu, E.L. ; Campbell, J.C.
Author_Institution :
Dept. of Electr. & Comput. Eng., Texas Univ., Austin, TX, USA
Abstract :
High speeds, high external quantum efficiencies, narrow spectral linewidths, and convenience in coupling make resonant-cavity photodetectors (RECAPs) good candidates for telecommunication applications. In this paper, we report a highly-efficient and wavelength-selective separate absorption and multiplication (SAM) avalanche photodiode (APD) with a thin (500 Å) absorbing layer. The improved characteristics of the photodetector were obtained by placing the absorption and multiplication layers in a Fabry-Perot cavity. An external quantum efficiency of 77% was achieved with a spectral linewidth of less than 4 nm and an avalanche gain of more than 50. We also present the experimental results on a RECAP having an operating wavelength λ0≈1.3 μm with a very narrow spectral response. The absorption takes place in a thin In0.53Ga0.47As layer placed in an InP cavity. The InP p-i-n structure was wafer bonded to a high-reflectivity GaAs-AlAs quarter-wavelength Bragg reflector. The top mirror consisted of three pairs of a ZnSe-CaF2 quarter-wavelength stack (QWS). A spectral linewidth of 1.8 nm was obtained with an external quantum efficiency of 48%
Keywords :
Fabry-Perot resonators; avalanche photodiodes; optical receivers; p-i-n photodiodes; photodetectors; spectral line breadth; 1.3 micron; 48 percent; 77 percent; Fabry-Perot cavity; GaAs-AlAs; GaAs/AlAs quarter-wavelength Bragg reflector; In0.53Ga0.47As; InP; InP cavity; InP p-i-n structure; ZnSe-CaF2; ZnSe/CaF2 quarter-wavelength stack; high external quantum efficiencies; high speed operation; narrow spectral linewidths; narrow spectral response photodiodes; resonant-cavity avalanche photodiodes; separate absorption/multiplication; thin In0.53Ga0.47As layer; top mirror; wafer bonding; wavelength-selective type; Absorption; Avalanche photodiodes; Fabry-Perot; Indium phosphide; Mirrors; Optical receivers; Optical sensors; PIN photodiodes; Photodetectors; Resonance;
Conference_Titel :
High Speed Semiconductor Devices and Circuits, 1995. Proceedings., IEEE/Cornell Conference on Advanced Concepts in
Conference_Location :
Ithaca, NY
Print_ISBN :
0-7803-3970-3
DOI :
10.1109/CORNEL.1995.482524