Title :
Computer integrated manufacturing [semiconductor processing]
Author :
Hodges, D.A. ; Rowe, L.A. ; Spanos, C.J.
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., California Univ., Berkeley, CA, USA
Abstract :
It is noted that, in computer-integrated manufacturing (CIM), there are many advantages to collecting and managing data from front-end and back-end operations in a logically integrated structured database. When this is done, correlations between elements in these data sets can be used to localize and quickly diagnose problems that reduce productivity. A simple and flexible system architecture suitable for this application is described. This CIM architecture is a two-level one. The lowest level includes the embedded controllers that provide real-time control of semiconductor analysis and fabrication equipment. Personal computers used as equipment controllers or for other tasks are included within this first level. The second level comprises a distributed network of computer workstations, file servers, and compute servers linked by a common distributed relational DBMS. Some workstations may be diskless; others may include local disks of varying sizes. A high-speed local area network (10 to 100 Mb/s) provides communications among processors at this level
Keywords :
CAD/CAM; computerised monitoring; database management systems; electronic engineering computing; integrated circuit manufacture; local area networks; manufacturing computer control; manufacturing data processing; production control; quality control; real-time systems; semiconductor device manufacture; 10 to 100 Mbit/s; CIM architecture; DBMS; IC manufacture; PC equipment controllers; compute servers; computer workstations; computer-integrated manufacturing; distributed network; distributed relational DBMS; embedded controllers; file servers; functional testing; high-speed LAN; local area network; quality control; real-time control; semiconductor fabrication equipment; two-level system architecture; yield analysis; Application software; Computer architecture; Computer integrated manufacturing; Computer networks; Databases; Distributed computing; Fabrication; File servers; Productivity; Workstations;
Conference_Titel :
Electronic Manufacturing Technology Symposium, 1989, Proceedings. Seventh IEEE/CHMT International
Conference_Location :
San Francisco, CA
DOI :
10.1109/EMTS.1989.68942