Title :
Integrated diagnostics for embedded memory built-in self test on PowerPCTM devices
Author_Institution :
NCSG Core Design Center, Motorola Inc., Austin, TX, USA
Abstract :
Integration of diagnostics with a memory built-in self-test (BIST) allowing both an effective and efficient manufacturing test as well as an effective diagnostic capability is detailed. Detection of failures within a memory are the primary objective of an embedded memory BIST. Inclusion of comprehensive diagnostics, to isolate faults incurred during the manufacturing or design process, are an extension to the memory BISI, further utilizing the existing circuitry and functionality. Detection and diagnosis of failures within an embedded memory can be realized throughout the entire manufacturing process
Keywords :
built-in self test; computer testing; integrated circuit testing; microprocessor chips; PowerPCTM devices; diagnostic capability; embedded memory built-in self test; integrated diagnostics; manufacturing test; Automatic testing; Built-in self-test; Circuit testing; Costs; Electrical fault detection; Frequency; Manufacturing processes; Process design; Random access memory; System testing;
Conference_Titel :
Computer Design: VLSI in Computers and Processors, 1997. ICCD '97. Proceedings., 1997 IEEE International Conference on
Conference_Location :
Austin, TX
Print_ISBN :
0-8186-8206-X
DOI :
10.1109/ICCD.1997.628920
