DocumentCode :
3169998
Title :
Automatic hardware test system for complex digital systems
Author :
Zhiming, Li ; Jiao San ; Guozhi, Xu
Author_Institution :
Electron. Eng. Dept, Shanghai Jiao Tong Univ., China
Volume :
2
fYear :
2002
fDate :
29 June-1 July 2002
Firstpage :
1351
Abstract :
Traditional automatic hardware testing deals mainly with stateless systems. With the rapidly increasing complexity of digital systems, software is more and more engaged in hardware testing. At present, such testing is still mainly carried out manually by engineers, consuming a lot of time and effort. In this paper, we propose an automatic hardware test system that can substantially save engineers´ time in testing. It can download the test cases to the target system one by one, receive test output, verify it, and generate log files. The test case generation platform is also discussed, which supports multiple test sets.
Keywords :
DRAM chips; SRAM chips; automatic test equipment; automatic test software; computational complexity; SDRAM timing; USB controller; automatic hardware test system; automatic hardware testing; automatic testing software; complex digital systems; complexity; multiple test sets; stateless systems; test case downloading; test case generation platform; test log files; test output verification; test time; Automatic testing; Design engineering; Digital systems; Hardware; Partial response channels; Software systems; Software testing; System testing; Systems engineering and theory; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Communications, Circuits and Systems and West Sino Expositions, IEEE 2002 International Conference on
Print_ISBN :
0-7803-7547-5
Type :
conf
DOI :
10.1109/ICCCAS.2002.1179032
Filename :
1179032
Link To Document :
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