DocumentCode
3169998
Title
Automatic hardware test system for complex digital systems
Author
Zhiming, Li ; Jiao San ; Guozhi, Xu
Author_Institution
Electron. Eng. Dept, Shanghai Jiao Tong Univ., China
Volume
2
fYear
2002
fDate
29 June-1 July 2002
Firstpage
1351
Abstract
Traditional automatic hardware testing deals mainly with stateless systems. With the rapidly increasing complexity of digital systems, software is more and more engaged in hardware testing. At present, such testing is still mainly carried out manually by engineers, consuming a lot of time and effort. In this paper, we propose an automatic hardware test system that can substantially save engineers´ time in testing. It can download the test cases to the target system one by one, receive test output, verify it, and generate log files. The test case generation platform is also discussed, which supports multiple test sets.
Keywords
DRAM chips; SRAM chips; automatic test equipment; automatic test software; computational complexity; SDRAM timing; USB controller; automatic hardware test system; automatic hardware testing; automatic testing software; complex digital systems; complexity; multiple test sets; stateless systems; test case downloading; test case generation platform; test log files; test output verification; test time; Automatic testing; Design engineering; Digital systems; Hardware; Partial response channels; Software systems; Software testing; System testing; Systems engineering and theory; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Communications, Circuits and Systems and West Sino Expositions, IEEE 2002 International Conference on
Print_ISBN
0-7803-7547-5
Type
conf
DOI
10.1109/ICCCAS.2002.1179032
Filename
1179032
Link To Document