• DocumentCode
    3169998
  • Title

    Automatic hardware test system for complex digital systems

  • Author

    Zhiming, Li ; Jiao San ; Guozhi, Xu

  • Author_Institution
    Electron. Eng. Dept, Shanghai Jiao Tong Univ., China
  • Volume
    2
  • fYear
    2002
  • fDate
    29 June-1 July 2002
  • Firstpage
    1351
  • Abstract
    Traditional automatic hardware testing deals mainly with stateless systems. With the rapidly increasing complexity of digital systems, software is more and more engaged in hardware testing. At present, such testing is still mainly carried out manually by engineers, consuming a lot of time and effort. In this paper, we propose an automatic hardware test system that can substantially save engineers´ time in testing. It can download the test cases to the target system one by one, receive test output, verify it, and generate log files. The test case generation platform is also discussed, which supports multiple test sets.
  • Keywords
    DRAM chips; SRAM chips; automatic test equipment; automatic test software; computational complexity; SDRAM timing; USB controller; automatic hardware test system; automatic hardware testing; automatic testing software; complex digital systems; complexity; multiple test sets; stateless systems; test case downloading; test case generation platform; test log files; test output verification; test time; Automatic testing; Design engineering; Digital systems; Hardware; Partial response channels; Software systems; Software testing; System testing; Systems engineering and theory; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Communications, Circuits and Systems and West Sino Expositions, IEEE 2002 International Conference on
  • Print_ISBN
    0-7803-7547-5
  • Type

    conf

  • DOI
    10.1109/ICCCAS.2002.1179032
  • Filename
    1179032