• DocumentCode
    3170053
  • Title

    A theoretical investigation for the effects of spectral hole burning, hot carrier, hot phonon, and carrier diffusion-capture-escape on the limitations of the modulation bandwidth in high-speed quantum well lasers

  • Author

    Tsai, Chin-Yi ; Lo, Yu-Hwa ; Spencer, Robert M. ; Eastman, Lester F. ; Tsai, Chin-Yao

  • Author_Institution
    Emerging Technol. Res. Center, De Montfort Univ., Leicester, UK
  • fYear
    1995
  • fDate
    7-9 Aug 1995
  • Firstpage
    415
  • Lastpage
    424
  • Abstract
    We present a theoretical model to investigate the effects of spectral hole burning, hot carrier, hot phonon, and carrier diffusion-capture-escape on the modulation response in quantum well (QW) lasers. We find that the degradation of the resonant frequency that limits the modulation bandwidth of QW lasers results from the enhancement of carrier escape and the suppression of carrier capture processes by the effect of carrier heating and lattice heating. The excess carrier heating is due to the finite lifetime of longitudinal optical phonons (i.e., effects of hot phonons)
  • Keywords
    electron-hole recombination; electron-phonon interactions; hot carriers; laser theory; optical hole burning; optical modulation; quantum well lasers; semiconductor device models; carrier capture process suppression; carrier diffusion-capture-escape; carrier escape enhancement; excess carrier heating; high-speed quantum well lasers; hot phonons; lattice heating; longitudinal optical phonon lifetime; modulation bandwidth limitations; modulation response; resonant frequency degradation; spectral hole burning; theoretical model; Bandwidth; Degradation; Heating; Hot carriers; Laser modes; Laser theory; Phonons; Quantum mechanics; Quantum well lasers; Resonant frequency;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    High Speed Semiconductor Devices and Circuits, 1995. Proceedings., IEEE/Cornell Conference on Advanced Concepts in
  • Conference_Location
    Ithaca, NY
  • ISSN
    1079-4700
  • Print_ISBN
    0-7803-3970-3
  • Type

    conf

  • DOI
    10.1109/CORNEL.1995.482535
  • Filename
    482535