Title :
A theoretical investigation for the effects of spectral hole burning, hot carrier, hot phonon, and carrier diffusion-capture-escape on the limitations of the modulation bandwidth in high-speed quantum well lasers
Author :
Tsai, Chin-Yi ; Lo, Yu-Hwa ; Spencer, Robert M. ; Eastman, Lester F. ; Tsai, Chin-Yao
Author_Institution :
Emerging Technol. Res. Center, De Montfort Univ., Leicester, UK
Abstract :
We present a theoretical model to investigate the effects of spectral hole burning, hot carrier, hot phonon, and carrier diffusion-capture-escape on the modulation response in quantum well (QW) lasers. We find that the degradation of the resonant frequency that limits the modulation bandwidth of QW lasers results from the enhancement of carrier escape and the suppression of carrier capture processes by the effect of carrier heating and lattice heating. The excess carrier heating is due to the finite lifetime of longitudinal optical phonons (i.e., effects of hot phonons)
Keywords :
electron-hole recombination; electron-phonon interactions; hot carriers; laser theory; optical hole burning; optical modulation; quantum well lasers; semiconductor device models; carrier capture process suppression; carrier diffusion-capture-escape; carrier escape enhancement; excess carrier heating; high-speed quantum well lasers; hot phonons; lattice heating; longitudinal optical phonon lifetime; modulation bandwidth limitations; modulation response; resonant frequency degradation; spectral hole burning; theoretical model; Bandwidth; Degradation; Heating; Hot carriers; Laser modes; Laser theory; Phonons; Quantum mechanics; Quantum well lasers; Resonant frequency;
Conference_Titel :
High Speed Semiconductor Devices and Circuits, 1995. Proceedings., IEEE/Cornell Conference on Advanced Concepts in
Conference_Location :
Ithaca, NY
Print_ISBN :
0-7803-3970-3
DOI :
10.1109/CORNEL.1995.482535