DocumentCode
3170129
Title
A TSC evaluation function for combinational circuits
Author
Bolchini, C. ; Sciuto, D. ; Salice, F.
Author_Institution
Dipt. di Elettronica, Politecnico di Milano, Italy
fYear
1997
fDate
12-15 Oct 1997
Firstpage
555
Lastpage
560
Abstract
The paper presents an innovative evaluation function for circuits with on-line detecting properties, which considers other aspects beyond area overhead. In particular, this function takes into account the probability of detecting a fault, once it occurs, with respect to the network structure and the application of input configurations. Different implementations of the same device designed to have TSC properties are compared with respect to this innovative evaluation function
Keywords
automatic testing; combinational circuits; TSC evaluation function; combinational circuits; network structure; on-line detecting properties; totally self checking circuits; Circuit faults; Circuit synthesis; Circuit testing; Combinational circuits; Concrete; Cost function; Design methodology; Electrical fault detection; Encoding; Fault detection;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer Design: VLSI in Computers and Processors, 1997. ICCD '97. Proceedings., 1997 IEEE International Conference on
Conference_Location
Austin, TX
ISSN
1063-6404
Print_ISBN
0-8186-8206-X
Type
conf
DOI
10.1109/ICCD.1997.628921
Filename
628921
Link To Document