Title :
A novel sensor-bridge-to-microcontroller interface
Author :
Custodio, A. ; Bragós, R. ; Pallàs-Areny, R.
Author_Institution :
Dept. d´´Enginyeria Electron., Univ. Politecnica de Catalunya, Barcelona, Spain
Abstract :
Sensor bridges are usually interfaced to microcontrollers by supplying the bridge with a voltage or current and digitizing the resulting voltage or current after being amplified and low-pass filtered. This paper proposes an alternative method to interface a sensor bridge to a microcontroller that does not need any active component between the bridge and the microcontroller The bridge is considered a network with three inputs and one output. The resistance of each input to the output depends on the measurand. Using each input in turn to charge a capacitor connected to the bridge output yields three different time intervals. For a full bridge (a sensor at each arm), the ratio between the difference between two time intervals and the third time interval yields the fractional resistance change. Two-point calibration reduces zero and gain errors attributable to the electrical parameters of the ports of the microcontroller. The absolute error for a 15 psi (103.4 kPa) pressure sensor with 5000 Ω arms and a full-scale output of 125 mV is below 0.05% of full scale, which is better than 1 LSB for an 11 bit ADC
Keywords :
analogue-digital conversion; bridge circuits; calibration; electric sensing devices; error compensation; microcontrollers; piezoresistive devices; pressure sensors; signal processing equipment; 125 mV; 15 psi; 5000 ohm; ADC; absolute error; fractional resistance change; gain errors; piezoresistive sensor; pressure sensor; sensor-bridge-to-microcontroller interface; signal conditioner; three input one output network; time intervals difference; two-point calibration; Arm; Bridge circuits; Calibration; Capacitors; Electric resistance; Electrical resistance measurement; Low pass filters; Microcontrollers; Sensor phenomena and characterization; Voltage;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 2001. IMTC 2001. Proceedings of the 18th IEEE
Conference_Location :
Budapest
Print_ISBN :
0-7803-6646-8
DOI :
10.1109/IMTC.2001.928206